NS-3500 is a high-speed confocal laser scanning microscope (CLSM) for precise and reliable 3-dimensional measurement.The real time confocal microscopic image is achieved by fast optical scanning modules and signal processing algorithms

Applications

It is a promising solution to measure and inspect the microscopic 3D structures such as semiconductor wafers, FPD products, MEMS devices, glass substrates, and material surfaces.

Technical Specifications