FastLine P300 C‑Sam

FastLine P300 was engineered to match the way of customers who wanted to use Acoustic Microscopes for non -automated production and process control.The FastLine Acoustic Microscope is specifically designed to accelerate inspection throughput in manual screening of microelectronic devices on the manufacturing floor


FastLine P300 can be used to procure Digital Image Analysis (DIA) including area fraction analysis, image enhancement, histogram, pixel amplitude analysis, plus image subtraction and addition,Package Region Analysis for ICs and ASF for surface flatness measurements for component analysis or any high-speed wafer inspection.

Technical Specifications