CMT-SR5000N

CMT-SR5000N Resistivity Measurement System

Sample size: up to 300mm or 210mm sq

The CMT-SR5000 is a high precision system equipped to measure the Sheet Resistance and Resistivity of Silicon Wafer and Solar cell. This system is designed for easy operation by a personal computer with exclusive software, and this software has function for various data analyses mapping and etc.

Features

X,Y,Z axes fully automatic system 
Auto & Manual range selection 
Systems for PV wafer SR-2000N-PV: 156mm x 156mm 
Perfect remote control by operating software
Data analysis (2D, 3D map, Data map, etc)
ASTM & SEMI quick measurement mode
Perfect remote control by operating software
Data analysis (2D, 3D map, Data map, etc)
ASTM & SEMI quick measurement mode