CMT-SR1000N Resistivity Measurement System

CMT-SR1000N Resistivity Measurement System

Sample Size: Up to 200mm dia or 140mm sq

This system is used for Sheet Resistance and Resistivity of Wafer, LCD, ITO, Solar cell, Fuel cell samples. 
Measurement is simply completed by pressing the "Measure" BUTTON only, and the measurement value is displayed on the LCD display window of the system.

Features     
    Automatic contact system(Center 1 point)     
    Automatic range selection          
    Data communication port & software